Characterization Of Nano-engineering Systems 2018/2019

1.  Relativistic dynamics; Atomic structure and transitions

2.  Radiation properties; Radiation – matter interaction

3.    X-ray photoemission spectroscopy (XPS), Auger electron spectroscopy (AES), Ultraviolet photoemission spectroscopy (UPS), electron energy loss spectroscopy (EELS): Principles and instrumentation.

4.    Secondary ion mass spectrometry (SIMS): Principles and instrumentation.

5.    Depth profiling and chemical imaging by using XPS, AES and SIMS techniques.

6.    Practical applications of surface analysis techniques: examples and experimental tests in the laboratory.

7.    Morphological characterization: Optical Microscopy, Atomic Force Microscopy (AFM), Scanning Tunneling Microscopy (STM), Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM). The instrumentations and the basic working principles of the different techniques will be illustrated.

8.    Optical spectroscopy of nanostructures. The main optical techniques such as absorption, reflection and photoluminescence will be explained. The influence of the small dimensions of the nanostructures on the optical properties will be discussed.

Some practical applications will be carried on and some laboratory instrumentations will be shown.